Seuential Screening in Semiconductor Manufacturing I MOBI

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H Screening in Semiconductor PDF has been to predict costs and actual yields and to determine the appropriate level of circuit integration Albin and Friedman's work on acceptance sampling appears to be the first to employ a yield model in a uality control context; they use a two parameter distribution the Neyman type A which is a Poisson compounded Poisson to model the number of defective chips on a wafer Because they were interested in uality control issues rather than circuit design issues they directly modeled the yield withoutAbout the PublisherForgotten b.

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